Rath, M., Chen, Y., Krieger, G., Sahib, H., Preziosi, D., & Salluzzo, M. (2024). Scanning tunnelling microscopy and X-ray photoemission studies of NdNiO2 infinite-layer nickelates films.
Style de citation Chicago (17e éd.)Rath, Martando, Yu Chen, Guillaume Krieger, H. Sahib, Daniele Preziosi, et Marco Salluzzo. Scanning Tunnelling Microscopy and X-ray Photoemission Studies of NdNiO2 Infinite-layer Nickelates Films. 2024.
Style de citation MLA (9e éd.)Rath, Martando, et al. Scanning Tunnelling Microscopy and X-ray Photoemission Studies of NdNiO2 Infinite-layer Nickelates Films. 2024.
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