CLT for generalized patterned random matrices: a unified approach

Fuente: arXiv
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Autori principali: S., Kiran Kumar A., Maurya, Shambhu Nath, Saha, Koushik
Natura: Preprint
Pubblicazione: 2024
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author S., Kiran Kumar A.
Maurya, Shambhu Nath
Saha, Koushik
author_facet S., Kiran Kumar A.
Maurya, Shambhu Nath
Saha, Koushik
contents In this paper, we derive a unified method for establishing the distributional convergence of linear eigenvalue statistics (LES) for generalized patterned random matrices. We prove that for an $N \times N$ generalized patterned random matrix with independent subexponential entries and even degree monomial test functions of degree $p_n=o(\log N/\log \log N)$, the LES converges to standard Gaussian distribution. This generalizes the CLT results on Gaussian patterned random matrices in Chatterjee(2009), Adhikari and Saha(2017). As an application, new results on LES of Toeplitz, Hankel, circulant-type matrices and block patterned random matrices for varying test functions are derived. For odd degree monomial test functions, we derive the limiting moments of LES and show that it may not converge to a Gaussian distribution.
format Preprint
id arxiv_https___arxiv_org_abs_2402_03745
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle CLT for generalized patterned random matrices: a unified approach
S., Kiran Kumar A.
Maurya, Shambhu Nath
Saha, Koushik
Probability
60B20, 60F05, 60G15
In this paper, we derive a unified method for establishing the distributional convergence of linear eigenvalue statistics (LES) for generalized patterned random matrices. We prove that for an $N \times N$ generalized patterned random matrix with independent subexponential entries and even degree monomial test functions of degree $p_n=o(\log N/\log \log N)$, the LES converges to standard Gaussian distribution. This generalizes the CLT results on Gaussian patterned random matrices in Chatterjee(2009), Adhikari and Saha(2017). As an application, new results on LES of Toeplitz, Hankel, circulant-type matrices and block patterned random matrices for varying test functions are derived. For odd degree monomial test functions, we derive the limiting moments of LES and show that it may not converge to a Gaussian distribution.
title CLT for generalized patterned random matrices: a unified approach
topic Probability
60B20, 60F05, 60G15
url https://arxiv.org/abs/2402.03745