Random features models: a way to study the success of naive imputation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ayme, Alexis, Boyer, Claire, Dieuleveut, Aymeric, Scornet, Erwan
Format:	Preprint
Published:	2024
Subjects:	Statistics Theory Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2402.03839