Loss and decoherence in superconducting circuits on silicon: Insights from electron spin resonance

Fuente: arXiv
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Autores principales: Jayaraman, Aditya, Danilov, Andrey V., Bylander, Jonas, Kubatkin, Sergey E.
Formato: Preprint
Publicado: 2024
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author Jayaraman, Aditya
Danilov, Andrey V.
Bylander, Jonas
Kubatkin, Sergey E.
author_facet Jayaraman, Aditya
Danilov, Andrey V.
Bylander, Jonas
Kubatkin, Sergey E.
contents Solid-state devices used for quantum computation and quantum sensing applications are adversely affected by loss and noise caused by spurious, charged two-level systems (TLS) and stray paramagnetic spins. These two sources of noise are interconnected, exacerbating the impact on circuit performance. We use an on-chip electron spin resonance (ESR) technique, with niobium nitride (NbN) superconducting resonators, to study surface spins on silicon and the effect of post-fabrication surface treatments. We identify two distinct spin species that are characterized by different spin-relaxation times and respond selectively to various surface treatments (annealing and hydrofluoric acid). Only one of the two spin species has a significant impact on the TLS-limited resonator quality factor at low-power (near single-photon) excitation. We observe a 3-to-5-fold reduction in the total density of spins after surface treatments, and demonstrate the efficacy of ESR spectroscopy in developing strategies to mitigate loss and decoherence in quantum systems.
format Preprint
id arxiv_https___arxiv_org_abs_2402_03889
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Loss and decoherence in superconducting circuits on silicon: Insights from electron spin resonance
Jayaraman, Aditya
Danilov, Andrey V.
Bylander, Jonas
Kubatkin, Sergey E.
Quantum Physics
Superconductivity
Solid-state devices used for quantum computation and quantum sensing applications are adversely affected by loss and noise caused by spurious, charged two-level systems (TLS) and stray paramagnetic spins. These two sources of noise are interconnected, exacerbating the impact on circuit performance. We use an on-chip electron spin resonance (ESR) technique, with niobium nitride (NbN) superconducting resonators, to study surface spins on silicon and the effect of post-fabrication surface treatments. We identify two distinct spin species that are characterized by different spin-relaxation times and respond selectively to various surface treatments (annealing and hydrofluoric acid). Only one of the two spin species has a significant impact on the TLS-limited resonator quality factor at low-power (near single-photon) excitation. We observe a 3-to-5-fold reduction in the total density of spins after surface treatments, and demonstrate the efficacy of ESR spectroscopy in developing strategies to mitigate loss and decoherence in quantum systems.
title Loss and decoherence in superconducting circuits on silicon: Insights from electron spin resonance
topic Quantum Physics
Superconductivity
url https://arxiv.org/abs/2402.03889