Demonstration of 4H silicon carbide on aluminum nitride integrated photonics platform
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arXiv
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| Autores principales: | , , , |
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| Formato: | Preprint |
| Publicado: |
2024
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| Acceso en línea: | |
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| _version_ | 1866914668946128896 |
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| author | Li, Jingwei Wang, Ruixuan Cai, Lutong Li, Qing |
| author_facet | Li, Jingwei Wang, Ruixuan Cai, Lutong Li, Qing |
| contents | The existing silicon-carbide-on-insulator photonic platform utilizes a thin layer of silicon dioxide under silicon carbide to provide optical confinement and mode isolation. Here, we replace the underneath silicon dioxide layer with a 1-$μ$m-thick aluminum nitride and demonstrate a 4H-silicon-carbide-on-aluminum-nitride integrated photonics platform for the first time. Efficient grating couplers, low-loss waveguides, and compact microring resonators with intrinsic quality factors up to 210,000 are fabricated. In addition, by undercutting the aluminum nitride layer, the intrinsic quality factor of the silicon carbide microring is improved by nearly one order of magnitude (1.8 million). Finally, an optical pump-probe method is developed to measure the thermal conductivity of the aluminum nitride layer, which is estimated to be over 30 times of that of silicon dioxide. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2402_04026 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Demonstration of 4H silicon carbide on aluminum nitride integrated photonics platform Li, Jingwei Wang, Ruixuan Cai, Lutong Li, Qing Optics Applied Physics The existing silicon-carbide-on-insulator photonic platform utilizes a thin layer of silicon dioxide under silicon carbide to provide optical confinement and mode isolation. Here, we replace the underneath silicon dioxide layer with a 1-$μ$m-thick aluminum nitride and demonstrate a 4H-silicon-carbide-on-aluminum-nitride integrated photonics platform for the first time. Efficient grating couplers, low-loss waveguides, and compact microring resonators with intrinsic quality factors up to 210,000 are fabricated. In addition, by undercutting the aluminum nitride layer, the intrinsic quality factor of the silicon carbide microring is improved by nearly one order of magnitude (1.8 million). Finally, an optical pump-probe method is developed to measure the thermal conductivity of the aluminum nitride layer, which is estimated to be over 30 times of that of silicon dioxide. |
| title | Demonstration of 4H silicon carbide on aluminum nitride integrated photonics platform |
| topic | Optics Applied Physics |
| url | https://arxiv.org/abs/2402.04026 |