Phase-type distributions for studying variability in resistive memories

Fuente: arXiv

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Bibliographic Details
Main Authors:	Acal, Christian, Ruiz-Castro, Juan E., Aguilera, Ana M., Jiménez-Molinos, Francisco, Roldán, Juan B.
Format:	Preprint
Published:	2024
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2402.04351