A method to observe field-region oxide charge and inter-electrode isolation from $CV$-characteristics of $n$-on-$p$ devices

Fuente: arXiv

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Bibliographic Details
Main Authors:	Abdilov, T., Akchurin, N., Carty, C., Kazhykarim, Y., Kuryatkov, V., Peltola, T., Wade, A.
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2402.04365