Capability enhancement of the X-ray micro-tomography system via ML-assisted approaches

Fuente: arXiv
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Autori principali: Shah, Dhruvi, Mehta, Shruti, Agrawal, Ashish, Purohit, Shishir, Chaudhury, Bhaskar
Natura: Preprint
Pubblicazione: 2024
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author Shah, Dhruvi
Mehta, Shruti
Agrawal, Ashish
Purohit, Shishir
Chaudhury, Bhaskar
author_facet Shah, Dhruvi
Mehta, Shruti
Agrawal, Ashish
Purohit, Shishir
Chaudhury, Bhaskar
contents Ring artifacts in X-ray micro-CT images are one of the primary causes of concern in their accurate visual interpretation and quantitative analysis. The geometry of X-ray micro-CT scanners is similar to the medical CT machines, except the sample is rotated with a stationary source and detector. The ring artifacts are caused by a defect or non-linear responses in detector pixels during the MicroCT data acquisition. Artifacts in MicroCT images can often be so severe that the images are no longer useful for further analysis. Therefore, it is essential to comprehend the causes of artifacts and potential solutions to maximize image quality. This article presents a convolution neural network (CNN)-based Deep Learning (DL) model inspired by UNet with a series of encoder and decoder units with skip connections for removal of ring artifacts. The proposed architecture has been evaluated using the Structural Similarity Index Measure (SSIM) and Mean Squared Error (MSE). Additionally, the results are compared with conventional filter-based non-ML techniques and are found to be better than the latter.
format Preprint
id arxiv_https___arxiv_org_abs_2402_05983
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Capability enhancement of the X-ray micro-tomography system via ML-assisted approaches
Shah, Dhruvi
Mehta, Shruti
Agrawal, Ashish
Purohit, Shishir
Chaudhury, Bhaskar
Image and Video Processing
Machine Learning
Applied Physics
Instrumentation and Detectors
Ring artifacts in X-ray micro-CT images are one of the primary causes of concern in their accurate visual interpretation and quantitative analysis. The geometry of X-ray micro-CT scanners is similar to the medical CT machines, except the sample is rotated with a stationary source and detector. The ring artifacts are caused by a defect or non-linear responses in detector pixels during the MicroCT data acquisition. Artifacts in MicroCT images can often be so severe that the images are no longer useful for further analysis. Therefore, it is essential to comprehend the causes of artifacts and potential solutions to maximize image quality. This article presents a convolution neural network (CNN)-based Deep Learning (DL) model inspired by UNet with a series of encoder and decoder units with skip connections for removal of ring artifacts. The proposed architecture has been evaluated using the Structural Similarity Index Measure (SSIM) and Mean Squared Error (MSE). Additionally, the results are compared with conventional filter-based non-ML techniques and are found to be better than the latter.
title Capability enhancement of the X-ray micro-tomography system via ML-assisted approaches
topic Image and Video Processing
Machine Learning
Applied Physics
Instrumentation and Detectors
url https://arxiv.org/abs/2402.05983