Resistive switching acceleration induced by thermal confinement

Fuente: arXiv
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Autores principales: Sarantopoulos, Alexandros, Lange, Kristof, Rivadulla, Francisco, Menzel, Stephan, Dittmann, Regina
Formato: Preprint
Publicado: 2024
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author Sarantopoulos, Alexandros
Lange, Kristof
Rivadulla, Francisco
Menzel, Stephan
Dittmann, Regina
author_facet Sarantopoulos, Alexandros
Lange, Kristof
Rivadulla, Francisco
Menzel, Stephan
Dittmann, Regina
contents Enhancing the switching speed of oxide-based memristive devices at a low voltage level is crucial for their use as non-volatile memory and their integration into emerging computing paradigms such as neuromorphic computing. Efforts to accelerate the switching speed often result in an energy tradeoff, leading to an increase of the minimum working voltage. In our study, we present an innovative solution: the introduction of a low thermal conductivity layer placed within the active electrode, which impedes the dissipation of heat generated during the switching process. The result is a notable acceleration in the switching speed of the memristive model system SrTiO$_{3}$ by a remarkable factor of 10$^{3}$, while preserving the integrity of the switching layer and the interfaces with the electrodes, rendering it adaptable to various filamentary memristive systems. The incorporation of HfO$_{2}$ or TaO$_{x}$ as heat-blocking layers not only streamlines the fabrication process, but also ensures compatibility with complementary metal-oxide-semiconductor technology.
format Preprint
id arxiv_https___arxiv_org_abs_2402_07603
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Resistive switching acceleration induced by thermal confinement
Sarantopoulos, Alexandros
Lange, Kristof
Rivadulla, Francisco
Menzel, Stephan
Dittmann, Regina
Applied Physics
Mesoscale and Nanoscale Physics
Materials Science
Enhancing the switching speed of oxide-based memristive devices at a low voltage level is crucial for their use as non-volatile memory and their integration into emerging computing paradigms such as neuromorphic computing. Efforts to accelerate the switching speed often result in an energy tradeoff, leading to an increase of the minimum working voltage. In our study, we present an innovative solution: the introduction of a low thermal conductivity layer placed within the active electrode, which impedes the dissipation of heat generated during the switching process. The result is a notable acceleration in the switching speed of the memristive model system SrTiO$_{3}$ by a remarkable factor of 10$^{3}$, while preserving the integrity of the switching layer and the interfaces with the electrodes, rendering it adaptable to various filamentary memristive systems. The incorporation of HfO$_{2}$ or TaO$_{x}$ as heat-blocking layers not only streamlines the fabrication process, but also ensures compatibility with complementary metal-oxide-semiconductor technology.
title Resistive switching acceleration induced by thermal confinement
topic Applied Physics
Mesoscale and Nanoscale Physics
Materials Science
url https://arxiv.org/abs/2402.07603