A two-stage solution to quantum process tomography: error analysis and optimal design

Fuente: arXiv
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Autori principali: Xiao, Shuixin, Wang, Yuanlong, Zhang, Jun, Dong, Daoyi, Mooney, Gary J., Petersen, Ian R., Yonezawa, Hidehiro
Natura: Preprint
Pubblicazione: 2024
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author Xiao, Shuixin
Wang, Yuanlong
Zhang, Jun
Dong, Daoyi
Mooney, Gary J.
Petersen, Ian R.
Yonezawa, Hidehiro
author_facet Xiao, Shuixin
Wang, Yuanlong
Zhang, Jun
Dong, Daoyi
Mooney, Gary J.
Petersen, Ian R.
Yonezawa, Hidehiro
contents Quantum process tomography is a critical task for characterizing the dynamics of quantum systems and achieving precise quantum control. In this paper, we propose a two-stage solution for both trace-preserving and non-trace-preserving quantum process tomography. Utilizing a tensor structure, our algorithm exhibits a computational complexity of $O(MLd^2)$ where $d$ is the dimension of the quantum system and $ M $, $ L $ represent the numbers of different input states and measurement operators, respectively. We establish an analytical error upper bound and then design the optimal input states and the optimal measurement operators, which are both based on minimizing the error upper bound and maximizing the robustness characterized by the condition number. Numerical examples and testing on IBM quantum devices are presented to demonstrate the performance and efficiency of our algorithm.
format Preprint
id arxiv_https___arxiv_org_abs_2402_08952
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle A two-stage solution to quantum process tomography: error analysis and optimal design
Xiao, Shuixin
Wang, Yuanlong
Zhang, Jun
Dong, Daoyi
Mooney, Gary J.
Petersen, Ian R.
Yonezawa, Hidehiro
Quantum Physics
Systems and Control
Quantum process tomography is a critical task for characterizing the dynamics of quantum systems and achieving precise quantum control. In this paper, we propose a two-stage solution for both trace-preserving and non-trace-preserving quantum process tomography. Utilizing a tensor structure, our algorithm exhibits a computational complexity of $O(MLd^2)$ where $d$ is the dimension of the quantum system and $ M $, $ L $ represent the numbers of different input states and measurement operators, respectively. We establish an analytical error upper bound and then design the optimal input states and the optimal measurement operators, which are both based on minimizing the error upper bound and maximizing the robustness characterized by the condition number. Numerical examples and testing on IBM quantum devices are presented to demonstrate the performance and efficiency of our algorithm.
title A two-stage solution to quantum process tomography: error analysis and optimal design
topic Quantum Physics
Systems and Control
url https://arxiv.org/abs/2402.08952