Assessing test artifact quality -- A tertiary study

Fuente: arXiv

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Bibliographic Details
Main Authors:	Tran, Huynh Khanh Vi, Unterkalmsteiner, Michael, Börstler, Jürgen, Ali, Nauman bin
Format:	Preprint
Published:	2024
Subjects:	Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2402.09541