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Exploring RIS Coverage Enhancement in Factories: From Ray-Based Modeling to Use-Case Analysis

Fuente: arXiv

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Bibliographic Details
Main Authors:	Bhatia, Gurjot Singh, Corre, Yoann, Tenoux, Thierry, Di Renzo, M.
Format:	Preprint
Published:	2024
Subjects:	Signal Processing
Online Access:	Acceder al recurso
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