Standardization of chemically selective atomic force microscopy for metal-oxide surfaces
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arXiv
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| Autori principali: | , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| _version_ | 1866915046258376704 |
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| author | Wiesener, Philipp Förster, Stefan Merkel, Milena Lammers, Bertram Schulze Fuchs, Harald Amirjalayer, Saeed Mönig, Harry |
| author_facet | Wiesener, Philipp Förster, Stefan Merkel, Milena Lammers, Bertram Schulze Fuchs, Harald Amirjalayer, Saeed Mönig, Harry |
| contents | The complex atomic structures and defects of metal-oxide surfaces are vital for a variety of applications in material science and chemistry. While scanning probe microscopy allows accessing atomic-scale structures in real space, elemental discrimination and defect characterization usually rely on indirect assumptions and extensive theoretical modelling. By investigating a variety of different sample systems with increasing structural complexity and inherent defects, we demonstrate that noncontact atomic force microscopy with an O-terminated copper tip allows imaging metal-oxide surfaces with a clear elemental contrast. This universal approach provides not only immediate access to the metal- and oxygen sub-lattices, but also to the chemical and structural configuration of atomic-scale defect structures. The observed contrast can be explained by purely electrostatic interactions between the negatively charged tip apex and the strongly varying electrostatic potential between metal- and oxygen surface sites. These results offer a standardized methodology for the direct structural characterization of even most-complex metal-oxide surfaces, which is highly relevant for a fundamental understanding of atomic-scale processes on these material systems. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2402_11045 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Standardization of chemically selective atomic force microscopy for metal-oxide surfaces Wiesener, Philipp Förster, Stefan Merkel, Milena Lammers, Bertram Schulze Fuchs, Harald Amirjalayer, Saeed Mönig, Harry Materials Science The complex atomic structures and defects of metal-oxide surfaces are vital for a variety of applications in material science and chemistry. While scanning probe microscopy allows accessing atomic-scale structures in real space, elemental discrimination and defect characterization usually rely on indirect assumptions and extensive theoretical modelling. By investigating a variety of different sample systems with increasing structural complexity and inherent defects, we demonstrate that noncontact atomic force microscopy with an O-terminated copper tip allows imaging metal-oxide surfaces with a clear elemental contrast. This universal approach provides not only immediate access to the metal- and oxygen sub-lattices, but also to the chemical and structural configuration of atomic-scale defect structures. The observed contrast can be explained by purely electrostatic interactions between the negatively charged tip apex and the strongly varying electrostatic potential between metal- and oxygen surface sites. These results offer a standardized methodology for the direct structural characterization of even most-complex metal-oxide surfaces, which is highly relevant for a fundamental understanding of atomic-scale processes on these material systems. |
| title | Standardization of chemically selective atomic force microscopy for metal-oxide surfaces |
| topic | Materials Science |
| url | https://arxiv.org/abs/2402.11045 |