Mesoscopic Stacking Reconfigurations in Stacked van der Waals Film
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arXiv
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| Autori principali: | , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2024
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| _version_ | 1866929248719077376 |
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| author | Heo, Yoon Seong Kim, Tae Wan Lee, Wooseok Choi, Jungseok Park, Soyeon Yeom, Dong-Il Lee, Jae-Ung |
| author_facet | Heo, Yoon Seong Kim, Tae Wan Lee, Wooseok Choi, Jungseok Park, Soyeon Yeom, Dong-Il Lee, Jae-Ung |
| contents | Mesoscopic-scale stacking reconfigurations are investigated when van der Waals films are stacked. We have developed a method to visualize complicated stacking structures and mechanical distortions simultaneously in stacked atom-thick films using Raman spectroscopy. In the rigid limit, we found that the distortions originate from the transfer process, which can be understood through thin film mechanics with a large elastic property mismatch. In contrast, with atomic corrugations, the in-plane strain fields are more closely correlated with the stacking configuration, highlighting the impact of atomic reconstructions on the mesoscopic scale. We discovered that the grain boundaries don`t have a significant effect while the cracks are causing inhomogeneous strain in stacked polycrystalline films. This result contributes to understanding the local variation of emerging properties from moiré structures and advancing the reliability of stacked vdW material fabrication. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2402_12773 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Mesoscopic Stacking Reconfigurations in Stacked van der Waals Film Heo, Yoon Seong Kim, Tae Wan Lee, Wooseok Choi, Jungseok Park, Soyeon Yeom, Dong-Il Lee, Jae-Ung Materials Science Mesoscopic-scale stacking reconfigurations are investigated when van der Waals films are stacked. We have developed a method to visualize complicated stacking structures and mechanical distortions simultaneously in stacked atom-thick films using Raman spectroscopy. In the rigid limit, we found that the distortions originate from the transfer process, which can be understood through thin film mechanics with a large elastic property mismatch. In contrast, with atomic corrugations, the in-plane strain fields are more closely correlated with the stacking configuration, highlighting the impact of atomic reconstructions on the mesoscopic scale. We discovered that the grain boundaries don`t have a significant effect while the cracks are causing inhomogeneous strain in stacked polycrystalline films. This result contributes to understanding the local variation of emerging properties from moiré structures and advancing the reliability of stacked vdW material fabrication. |
| title | Mesoscopic Stacking Reconfigurations in Stacked van der Waals Film |
| topic | Materials Science |
| url | https://arxiv.org/abs/2402.12773 |