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Robust single divacancy defects near stacking faults in 4H-SiC under resonant excitation

Fuente: arXiv

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Bibliographic Details
Main Authors:	He, Zhen-Xuan, Zhou, Ji-Yang, Lin, Wu-Xi, Li, Qiang, Liang, Rui-Jian, Wang, Jun-Feng, Wen, Xiao-Lei, Hao, Zhi-He, Liu, Wei, Ren, Shuo, Li, Hao, You, Li-Xing, Tang, Jian-Shun, Xu, Jin-Shi, Li, Chuan-Feng, Guo, Guang-Can
Format:	Preprint
Published:	2024
Subjects:	Quantum Physics
Online Access:	Acceder al recurso
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