Low frequency resistance fluctuations in an ionic liquid gated channel probed by cross-correlation noise spectroscopy
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| Main Authors: | , , , , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866929250251046912 |
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| author | Barik, Bikash C. Chakraborti, Himadri Jain, Aditya K. Pal, Buddhadeb Beere, H. E. Ritchie, D. A. Gupta, K. Das |
| author_facet | Barik, Bikash C. Chakraborti, Himadri Jain, Aditya K. Pal, Buddhadeb Beere, H. E. Ritchie, D. A. Gupta, K. Das |
| contents | A system in equilibrium keeps ``exploring" nearby states in the phase space and consequently, fluctuations can contain information, that the mean value does not. However, such measurements involve a fairly complex interplay of effects arising in the device and measurement electronics, that are non-trivial to disentangle. In this paper, we briefly analyse some of these issues and show the relevance of a two-amplifier cross-correlation technique for semiconductors and thin films commonly encountered. We show that by using home-built amplifiers costing less than $10$ USD/piece one can measure spectral densities as low as $\sim 10^{-18}-10^{-19}~ {\rm {V^2}{Hz^{-1}}}$. We apply this method to an ionic liquid gated Ga:ZnO channel and show that the glass transition of the ionic liquid brings about a change in the exponent of the low frequency resistance fluctuations. Our analysis suggests that a log-normal distribution of the Debye relaxation times of the fluctuations and an increased weight of the long timescale relaxations can give a semi-quantitative explanation of the observed change in the exponent. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2402_13363 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Low frequency resistance fluctuations in an ionic liquid gated channel probed by cross-correlation noise spectroscopy Barik, Bikash C. Chakraborti, Himadri Jain, Aditya K. Pal, Buddhadeb Beere, H. E. Ritchie, D. A. Gupta, K. Das Mesoscale and Nanoscale Physics Materials Science A system in equilibrium keeps ``exploring" nearby states in the phase space and consequently, fluctuations can contain information, that the mean value does not. However, such measurements involve a fairly complex interplay of effects arising in the device and measurement electronics, that are non-trivial to disentangle. In this paper, we briefly analyse some of these issues and show the relevance of a two-amplifier cross-correlation technique for semiconductors and thin films commonly encountered. We show that by using home-built amplifiers costing less than $10$ USD/piece one can measure spectral densities as low as $\sim 10^{-18}-10^{-19}~ {\rm {V^2}{Hz^{-1}}}$. We apply this method to an ionic liquid gated Ga:ZnO channel and show that the glass transition of the ionic liquid brings about a change in the exponent of the low frequency resistance fluctuations. Our analysis suggests that a log-normal distribution of the Debye relaxation times of the fluctuations and an increased weight of the long timescale relaxations can give a semi-quantitative explanation of the observed change in the exponent. |
| title | Low frequency resistance fluctuations in an ionic liquid gated channel probed by cross-correlation noise spectroscopy |
| topic | Mesoscale and Nanoscale Physics Materials Science |
| url | https://arxiv.org/abs/2402.13363 |