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| Main Authors: | , , , |
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| Format: | Preprint |
| Published: |
2024
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2402.15501 |
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| _version_ | 1866913241642303488 |
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| author | Cohn, Rachael L. Petroff, Christopher A. McGhee, Virginia E. Marohn, John A. |
| author_facet | Cohn, Rachael L. Petroff, Christopher A. McGhee, Virginia E. Marohn, John A. |
| contents | We used broadband local dielectric spectroscopy (BLDS), an electric force microscopy technique, to make non-contact measurements of conductivity in the dark and under illumination of PM6:Y6 and Y6 prepared on ITO and PEDOT:PSS/ITO. Over a range of illumination intensities, BLDS spectra were acquired and fit to an impedance model of the tip-sample interaction to obtain a sample resistance and capacitance. By comparing two descriptions of cantilever friction, an impedance model and a microscopic model, we connected the sample resistance inferred from impedance modeling to a microscopic sample conductivity. A charge recombination rate was estimated from plots of the conductivity versus light intensity and found to be sub-Langevin. The dark conductivity was orders of magnitude higher than expected from Fermi-level equilibration of the PM6:Y6 with the substrate, suggesting that dark carriers may be a source of open-circuit voltage loss in PM6:Y6. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2402_15501 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Electrical Scanning Probe Microscope Measurements Reveal Surprisingly High Dark Conductivity in Y6 and PM6:Y6 and Non-Langevin Recombination in PM6:Y6 Cohn, Rachael L. Petroff, Christopher A. McGhee, Virginia E. Marohn, John A. Materials Science Applied Physics We used broadband local dielectric spectroscopy (BLDS), an electric force microscopy technique, to make non-contact measurements of conductivity in the dark and under illumination of PM6:Y6 and Y6 prepared on ITO and PEDOT:PSS/ITO. Over a range of illumination intensities, BLDS spectra were acquired and fit to an impedance model of the tip-sample interaction to obtain a sample resistance and capacitance. By comparing two descriptions of cantilever friction, an impedance model and a microscopic model, we connected the sample resistance inferred from impedance modeling to a microscopic sample conductivity. A charge recombination rate was estimated from plots of the conductivity versus light intensity and found to be sub-Langevin. The dark conductivity was orders of magnitude higher than expected from Fermi-level equilibration of the PM6:Y6 with the substrate, suggesting that dark carriers may be a source of open-circuit voltage loss in PM6:Y6. |
| title | Electrical Scanning Probe Microscope Measurements Reveal Surprisingly High Dark Conductivity in Y6 and PM6:Y6 and Non-Langevin Recombination in PM6:Y6 |
| topic | Materials Science Applied Physics |
| url | https://arxiv.org/abs/2402.15501 |