Gespeichert in:
| Hauptverfasser: | , , , , |
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| Format: | Preprint |
| Veröffentlicht: |
2024
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| Schlagworte: | |
| Online-Zugang: | https://arxiv.org/abs/2402.16257 |
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Inhaltsangabe:
- The resistivity of a superconductor in its normal state plays a critical role in determining its superconducting ground state. However, measuring the resistivity of a material under high pressure has long presented a significant technical challenge due to pressure-induced changes in the crystallographic directions, especially for samples with anisotropic layered structures like high-Tc superconductors and other intriguing quantum materials. Here, we are the first to propose a novel and effective method for determining high-pressure resistivity, which relies on the ambient-pressure resistivity, initial sample sizes, lattice parameters, high-pressure resistance, and lattice parameters measured from the same sample. Its validity has been confirmed through our investigations of pressurized copper-oxide superconductors, which demonstrates that this method provides new possibilities for researchers conducting high-pressure studies related to resistivity of these materials.