Acceptor-induced bulk dielectric loss in superconducting circuits on silicon

Fuente: arXiv
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Hauptverfasser: Zhang, Zi-Huai, Godeneli, Kadircan, He, Justin, Odeh, Mutasem, Zhou, Haoxin, Meesala, Srujan, Sipahigil, Alp
Format: Preprint
Veröffentlicht: 2024
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author Zhang, Zi-Huai
Godeneli, Kadircan
He, Justin
Odeh, Mutasem
Zhou, Haoxin
Meesala, Srujan
Sipahigil, Alp
author_facet Zhang, Zi-Huai
Godeneli, Kadircan
He, Justin
Odeh, Mutasem
Zhou, Haoxin
Meesala, Srujan
Sipahigil, Alp
contents The performance of superconducting quantum circuits is primarily limited by dielectric loss due to interactions with two-level systems (TLS). State-of-the-art circuits with engineered material interfaces are approaching a limit where dielectric loss from bulk substrates plays an important role. However, a microscopic understanding of dielectric loss in crystalline substrates is still lacking. In this work, we show that boron acceptors in silicon constitute a strongly coupled TLS bath for superconducting circuits. We discuss how the electronic structure of boron acceptors leads to an effective TLS response in silicon. We sweep the boron concentration in silicon and demonstrate the bulk dielectric loss limit from boron acceptors. We show that boron-induced dielectric loss can be reduced in a magnetic field due to the spin-orbit structure of boron. This work provides the first detailed microscopic description of a TLS bath for superconducting circuits, and demonstrates the need for ultrahigh purity substrates for next-generation superconducting quantum processors.
format Preprint
id arxiv_https___arxiv_org_abs_2402_17155
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Acceptor-induced bulk dielectric loss in superconducting circuits on silicon
Zhang, Zi-Huai
Godeneli, Kadircan
He, Justin
Odeh, Mutasem
Zhou, Haoxin
Meesala, Srujan
Sipahigil, Alp
Quantum Physics
Mesoscale and Nanoscale Physics
The performance of superconducting quantum circuits is primarily limited by dielectric loss due to interactions with two-level systems (TLS). State-of-the-art circuits with engineered material interfaces are approaching a limit where dielectric loss from bulk substrates plays an important role. However, a microscopic understanding of dielectric loss in crystalline substrates is still lacking. In this work, we show that boron acceptors in silicon constitute a strongly coupled TLS bath for superconducting circuits. We discuss how the electronic structure of boron acceptors leads to an effective TLS response in silicon. We sweep the boron concentration in silicon and demonstrate the bulk dielectric loss limit from boron acceptors. We show that boron-induced dielectric loss can be reduced in a magnetic field due to the spin-orbit structure of boron. This work provides the first detailed microscopic description of a TLS bath for superconducting circuits, and demonstrates the need for ultrahigh purity substrates for next-generation superconducting quantum processors.
title Acceptor-induced bulk dielectric loss in superconducting circuits on silicon
topic Quantum Physics
Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2402.17155