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Main Authors: Kazimi, Bashir, Ruzaeva, Karina, Sandfeld, Stefan
Format: Preprint
Published: 2024
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Online Access:https://arxiv.org/abs/2402.18286
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author Kazimi, Bashir
Ruzaeva, Karina
Sandfeld, Stefan
author_facet Kazimi, Bashir
Ruzaeva, Karina
Sandfeld, Stefan
contents In this work, we explore the potential of self-supervised learning with Generative Adversarial Networks (GANs) for electron microscopy datasets. We show how self-supervised pretraining facilitates efficient fine-tuning for a spectrum of downstream tasks, including semantic segmentation, denoising, noise \& background removal, and super-resolution. Experimentation with varying model complexities and receptive field sizes reveals the remarkable phenomenon that fine-tuned models of lower complexity consistently outperform more complex models with random weight initialization. We demonstrate the versatility of self-supervised pretraining across various downstream tasks in the context of electron microscopy, allowing faster convergence and better performance. We conclude that self-supervised pretraining serves as a powerful catalyst, being especially advantageous when limited annotated data are available and efficient scaling of computational cost is important.
format Preprint
id arxiv_https___arxiv_org_abs_2402_18286
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy
Kazimi, Bashir
Ruzaeva, Karina
Sandfeld, Stefan
Computer Vision and Pattern Recognition
Materials Science
Artificial Intelligence
Machine Learning
In this work, we explore the potential of self-supervised learning with Generative Adversarial Networks (GANs) for electron microscopy datasets. We show how self-supervised pretraining facilitates efficient fine-tuning for a spectrum of downstream tasks, including semantic segmentation, denoising, noise \& background removal, and super-resolution. Experimentation with varying model complexities and receptive field sizes reveals the remarkable phenomenon that fine-tuned models of lower complexity consistently outperform more complex models with random weight initialization. We demonstrate the versatility of self-supervised pretraining across various downstream tasks in the context of electron microscopy, allowing faster convergence and better performance. We conclude that self-supervised pretraining serves as a powerful catalyst, being especially advantageous when limited annotated data are available and efficient scaling of computational cost is important.
title Self-Supervised Learning with Generative Adversarial Networks for Electron Microscopy
topic Computer Vision and Pattern Recognition
Materials Science
Artificial Intelligence
Machine Learning
url https://arxiv.org/abs/2402.18286