Anomalous Hall Effect in Thin Bismuth

Fuente: arXiv
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Auteurs principaux: Yu, Oulin, Vijayakrishnan, Sujatha, Allgayer, R., Szkopek, T., Gervais, G.
Format: Preprint
Publié: 2024
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author Yu, Oulin
Vijayakrishnan, Sujatha
Allgayer, R.
Szkopek, T.
Gervais, G.
author_facet Yu, Oulin
Vijayakrishnan, Sujatha
Allgayer, R.
Szkopek, T.
Gervais, G.
contents Bismuth, the heaviest of all group V elements with strong spin-orbit coupling, is famously known to exhibit many interesting transport properties, and effects such as Shubnikov-de Haas and de Haas-van Alphen were first revealed in its bulk form. However, the transport properties have not yet been fully explored experimentally in thin bismuth nor in its 2D limit. In this work, bismuth flakes with average thicknesses ranging from 29 to 69 nm were mechanically exfoliated by a micro-trench technique and were used to fabricate four-point devices. Due to mixing of components, Onsager's relations were used to extract the longitudinal ($R_{xx}$) and Hall ($R_{xy}$) resistances where the latter shows a Hall anomaly that is consistent with the Anomalous Hall Effect (AHE). Our work strongly suggests that that there could be a hidden mechanism for time-reversal symmetry breaking in pure bismuth thin films.
format Preprint
id arxiv_https___arxiv_org_abs_2402_18441
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Anomalous Hall Effect in Thin Bismuth
Yu, Oulin
Vijayakrishnan, Sujatha
Allgayer, R.
Szkopek, T.
Gervais, G.
Mesoscale and Nanoscale Physics
Bismuth, the heaviest of all group V elements with strong spin-orbit coupling, is famously known to exhibit many interesting transport properties, and effects such as Shubnikov-de Haas and de Haas-van Alphen were first revealed in its bulk form. However, the transport properties have not yet been fully explored experimentally in thin bismuth nor in its 2D limit. In this work, bismuth flakes with average thicknesses ranging from 29 to 69 nm were mechanically exfoliated by a micro-trench technique and were used to fabricate four-point devices. Due to mixing of components, Onsager's relations were used to extract the longitudinal ($R_{xx}$) and Hall ($R_{xy}$) resistances where the latter shows a Hall anomaly that is consistent with the Anomalous Hall Effect (AHE). Our work strongly suggests that that there could be a hidden mechanism for time-reversal symmetry breaking in pure bismuth thin films.
title Anomalous Hall Effect in Thin Bismuth
topic Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2402.18441