Rethinking The Uniformity Metric in Self-Supervised Learning

Fuente: arXiv

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Bibliographic Details
Main Authors:	Fang, Xianghong, Li, Jian, Sun, Qiang, Wang, Benyou
Format:	Preprint
Published:	2024
Subjects:	Machine Learning Artificial Intelligence Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.00642