Anodization-free fabrication process for high-quality cross-type Josephson tunnel junctions based on a Nb/Al-AlO$_x$/Nb trilayer

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Auteurs principaux: Adam, Fabienne, Enss, Christian, Kempf, Sebastian
Format: Preprint
Publié: 2024
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author Adam, Fabienne
Enss, Christian
Kempf, Sebastian
author_facet Adam, Fabienne
Enss, Christian
Kempf, Sebastian
contents Josephson tunnel junctions form the basis for various superconducting electronic devices. For this reason, enormous efforts are routinely taken to establish and later on maintain a scalable and reproducible wafer-scale manufacturing process for high-quality Josephson junctions. Here, we present an anodization-free fabrication process for Nb/Al-AlO$_x$/Nb cross-type Josephson junctions that requires only a small number of process steps and that is intrinsically compatible with wafer-scale fabrication. We show that the fabricated junctions are of very high-quality and, compared to other junction types, exhibit not only a significantly reduced capacitance but also an almost rectangular critical current density profile. Our process hence enables the usage of low capacitance Josephson junctions for superconducting electronic devices such as ultra-low noise dc-SQUIDs, microwave SQUID multiplexers based on non-hysteretic rf-SQUIDs and RFSQ circuits.
format Preprint
id arxiv_https___arxiv_org_abs_2403_01806
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Anodization-free fabrication process for high-quality cross-type Josephson tunnel junctions based on a Nb/Al-AlO$_x$/Nb trilayer
Adam, Fabienne
Enss, Christian
Kempf, Sebastian
Superconductivity
Instrumentation and Detectors
Josephson tunnel junctions form the basis for various superconducting electronic devices. For this reason, enormous efforts are routinely taken to establish and later on maintain a scalable and reproducible wafer-scale manufacturing process for high-quality Josephson junctions. Here, we present an anodization-free fabrication process for Nb/Al-AlO$_x$/Nb cross-type Josephson junctions that requires only a small number of process steps and that is intrinsically compatible with wafer-scale fabrication. We show that the fabricated junctions are of very high-quality and, compared to other junction types, exhibit not only a significantly reduced capacitance but also an almost rectangular critical current density profile. Our process hence enables the usage of low capacitance Josephson junctions for superconducting electronic devices such as ultra-low noise dc-SQUIDs, microwave SQUID multiplexers based on non-hysteretic rf-SQUIDs and RFSQ circuits.
title Anodization-free fabrication process for high-quality cross-type Josephson tunnel junctions based on a Nb/Al-AlO$_x$/Nb trilayer
topic Superconductivity
Instrumentation and Detectors
url https://arxiv.org/abs/2403.01806