Stochastic dynamics of the resistively shunted superconducting tunnel junction system under the impact of thermal fluctuations

Fuente: arXiv
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Main Author: Yuan, Shenglan
Format: Preprint
Published: 2024
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author Yuan, Shenglan
author_facet Yuan, Shenglan
contents In this work, a Josephson junction consisting of two superconducting layers sandwiching an insulating layer is explored, which is subject to the effects of thermal fluctuations. The precise expressions for the evolution of Josephson phase and the supercurrent through the junction are derived. A clockwise hysteresis cycle in the current-voltage characteristic curve is demonstrated mathematically. Additionally, the bifurcation of a planar limit cycle is established. The numerous stochastic thermodynamic properties of the resistively shunted superconducting tunnel junction system are described, considering the influence of three specific parameters: the conductance, the current bias and the noise intensity. Moreover, the probability density is characterized using the Fokker-Planck equation.
format Preprint
id arxiv_https___arxiv_org_abs_2403_02143
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Stochastic dynamics of the resistively shunted superconducting tunnel junction system under the impact of thermal fluctuations
Yuan, Shenglan
Superconductivity
Dynamical Systems
In this work, a Josephson junction consisting of two superconducting layers sandwiching an insulating layer is explored, which is subject to the effects of thermal fluctuations. The precise expressions for the evolution of Josephson phase and the supercurrent through the junction are derived. A clockwise hysteresis cycle in the current-voltage characteristic curve is demonstrated mathematically. Additionally, the bifurcation of a planar limit cycle is established. The numerous stochastic thermodynamic properties of the resistively shunted superconducting tunnel junction system are described, considering the influence of three specific parameters: the conductance, the current bias and the noise intensity. Moreover, the probability density is characterized using the Fokker-Planck equation.
title Stochastic dynamics of the resistively shunted superconducting tunnel junction system under the impact of thermal fluctuations
topic Superconductivity
Dynamical Systems
url https://arxiv.org/abs/2403.02143