Influence of GaN substrate miscut on the XRD quantification of plastic relaxation in InGaN

Fuente: arXiv
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Bibliographic Details
Main Authors: Moneta, J., Krysko, M., Domagala, J. Z., Grzanka, E., Muziol, G., Siekacz, M., Leszczynski, M., Smalc-Koziorowska, J.
Format: Preprint
Published: 2024
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