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Influence of GaN substrate miscut on the XRD quantification of plastic relaxation in InGaN

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Moneta, J., Krysko, M., Domagala, J. Z., Grzanka, E., Muziol, G., Siekacz, M., Leszczynski, M., Smalc-Koziorowska, J.
Natura:	Preprint
Pubblicazione:	2024
Soggetti:	Materials Science
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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