CrackNex: a Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yao, Zhen, Xu, Jiawei, Hou, Shuhang, Chuah, Mooi Choo
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.03063