Characterization of the low electric field and zero-temperature two-level-system loss in hydrogenated amorphous silicon

Fuente: arXiv

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Bibliographic Details
Main Authors:	Defrance, Fabien, Beyer, Andrew D., Shu, Shibo, Sayers, Jack, Golwala, Sunil R.
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors Instrumentation and Methods for Astrophysics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.03534