Characterization of the low electric field and zero-temperature two-level-system loss in hydrogenated amorphous silicon
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arXiv
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| Main Authors: | Defrance, Fabien, Beyer, Andrew D., Shu, Shibo, Sayers, Jack, Golwala, Sunil R. |
|---|---|
| Format: | Preprint |
| Published: |
2024
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| Online Access: | |
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