Atom probe tomography: a local probe for chemical bonds in solids

Fuente: arXiv
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Auteurs principaux: Cojocaru-Mirédin, Oana, Yu, Yuan, Köttgen, Jan, Ghosh, Tanmoy, Schön, Carl-Friedrich, Han, Shuai, Zhou, Chongjian, Wuttig, Matthias
Format: Preprint
Publié: 2024
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author Cojocaru-Mirédin, Oana
Yu, Yuan
Köttgen, Jan
Ghosh, Tanmoy
Schön, Carl-Friedrich
Han, Shuai
Zhou, Chongjian
Wuttig, Matthias
author_facet Cojocaru-Mirédin, Oana
Yu, Yuan
Köttgen, Jan
Ghosh, Tanmoy
Schön, Carl-Friedrich
Han, Shuai
Zhou, Chongjian
Wuttig, Matthias
contents Atom probe tomography is frequently employed to characterize the elemental distribution in solids with atomic resolution. Here we review and discuss the potential of this technique to locally probe chemical bonds. Two processes characterize the bond rupture in laser-assisted field emission, the probability of molecular ions, i.e. the probability that molecular ions (PMI) are evaporated instead of single (atomic) ions, and the probability of multiple events, i.e. the correlated field-evaporation of more than a single fragment (PME) upon laser- or voltage pulse excitation. Here we demonstrate that one can clearly distinguish solids with metallic, covalent, and metavalent bonds based on their bond rupture, i.e. their PME and PMI values. Differences in the field penetration depth can largely explain these differences in bond breaking. These findings open new avenues in understanding and designing advanced materials, since they allow a quantification of bonds in solids on a nanometer scale, as will be shown for several examples. These possibilities would even justify calling the present approach bonding probe tomography (BPT).
format Preprint
id arxiv_https___arxiv_org_abs_2403_04093
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Atom probe tomography: a local probe for chemical bonds in solids
Cojocaru-Mirédin, Oana
Yu, Yuan
Köttgen, Jan
Ghosh, Tanmoy
Schön, Carl-Friedrich
Han, Shuai
Zhou, Chongjian
Wuttig, Matthias
Materials Science
Atom probe tomography is frequently employed to characterize the elemental distribution in solids with atomic resolution. Here we review and discuss the potential of this technique to locally probe chemical bonds. Two processes characterize the bond rupture in laser-assisted field emission, the probability of molecular ions, i.e. the probability that molecular ions (PMI) are evaporated instead of single (atomic) ions, and the probability of multiple events, i.e. the correlated field-evaporation of more than a single fragment (PME) upon laser- or voltage pulse excitation. Here we demonstrate that one can clearly distinguish solids with metallic, covalent, and metavalent bonds based on their bond rupture, i.e. their PME and PMI values. Differences in the field penetration depth can largely explain these differences in bond breaking. These findings open new avenues in understanding and designing advanced materials, since they allow a quantification of bonds in solids on a nanometer scale, as will be shown for several examples. These possibilities would even justify calling the present approach bonding probe tomography (BPT).
title Atom probe tomography: a local probe for chemical bonds in solids
topic Materials Science
url https://arxiv.org/abs/2403.04093