Direct observation of electronic band gap and hot carrier dynamics in GeAs semiconductor

Fuente: arXiv
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Autores principales: Zhang, Zailan, Zhang, Jiuxiang, Zhou, Gangqiang, Xu, Jiyuan, Zhang, Xiao, Oughaddou, Hamid, Qi, Weiyan, Papalazarou, Evangelos, Perfetti, Luca, Chen, Zhesheng, Bendounan, Azzedine, Marsi, Marino
Formato: Preprint
Publicado: 2024
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author Zhang, Zailan
Zhang, Jiuxiang
Zhou, Gangqiang
Xu, Jiyuan
Zhang, Xiao
Oughaddou, Hamid
Qi, Weiyan
Papalazarou, Evangelos
Perfetti, Luca
Chen, Zhesheng
Bendounan, Azzedine
Marsi, Marino
author_facet Zhang, Zailan
Zhang, Jiuxiang
Zhou, Gangqiang
Xu, Jiyuan
Zhang, Xiao
Oughaddou, Hamid
Qi, Weiyan
Papalazarou, Evangelos
Perfetti, Luca
Chen, Zhesheng
Bendounan, Azzedine
Marsi, Marino
contents Germanium arsenide (GeAs) is a layered semiconductor with remarkably anisotropic physical, thermoelectric and optical properties, and a promising candidate for multifunctional devices based on in-plane polarization dependent response. Understanding the underlying mechanism of such devices requires the knowledge of GeAs electronic band structure and of the hot carrier dynamics in its conduction band, whose details are still unclear. In this work, we investigated the properties of occupied and photoexcited states of GeAs in energy-momentum space, by combining scanning tunneling spectroscopy (STS), angle-resolved photoemission spectroscopy (ARPES) and time-resolved ARPES. We found that, GeAs is an indirect gap semiconductor having an electronic gap of 0.8 eV, for which the conduction band minimum (CBM) is located at the Gamma point while the valence band maximum (VBM) is out of Gamma. A Stark broadening of the valence band is observed immediately after photoexcitation, which can be attributed to the effects of the electrical field at the surface induced by inhomogeneous screening. Moreover, the hot electrons relaxation time of 1.56 ps down to the CBM which is dominated from both inter-valley and intra-valley coupling. Besides their relevance for our understanding of GeAs, these findings present general interest for the design on high performance thermoelectric and optoelectronic devices based on 2D semiconductors.
format Preprint
id arxiv_https___arxiv_org_abs_2403_04587
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Direct observation of electronic band gap and hot carrier dynamics in GeAs semiconductor
Zhang, Zailan
Zhang, Jiuxiang
Zhou, Gangqiang
Xu, Jiyuan
Zhang, Xiao
Oughaddou, Hamid
Qi, Weiyan
Papalazarou, Evangelos
Perfetti, Luca
Chen, Zhesheng
Bendounan, Azzedine
Marsi, Marino
Materials Science
Germanium arsenide (GeAs) is a layered semiconductor with remarkably anisotropic physical, thermoelectric and optical properties, and a promising candidate for multifunctional devices based on in-plane polarization dependent response. Understanding the underlying mechanism of such devices requires the knowledge of GeAs electronic band structure and of the hot carrier dynamics in its conduction band, whose details are still unclear. In this work, we investigated the properties of occupied and photoexcited states of GeAs in energy-momentum space, by combining scanning tunneling spectroscopy (STS), angle-resolved photoemission spectroscopy (ARPES) and time-resolved ARPES. We found that, GeAs is an indirect gap semiconductor having an electronic gap of 0.8 eV, for which the conduction band minimum (CBM) is located at the Gamma point while the valence band maximum (VBM) is out of Gamma. A Stark broadening of the valence band is observed immediately after photoexcitation, which can be attributed to the effects of the electrical field at the surface induced by inhomogeneous screening. Moreover, the hot electrons relaxation time of 1.56 ps down to the CBM which is dominated from both inter-valley and intra-valley coupling. Besides their relevance for our understanding of GeAs, these findings present general interest for the design on high performance thermoelectric and optoelectronic devices based on 2D semiconductors.
title Direct observation of electronic band gap and hot carrier dynamics in GeAs semiconductor
topic Materials Science
url https://arxiv.org/abs/2403.04587