Cita APA (7a ed.)

Rolih, B., Ameln, D., Vaidya, A., & Akcay, S. (2024). Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble.

Cita Chicago Style (17a ed.)

Rolih, Blaž, Dick Ameln, Ashwin Vaidya, y Samet Akcay. Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble. 2024.

Cita MLA (9a ed.)

Rolih, Blaž, et al. Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble. 2024.

Precaución: Estas citas no son 100% exactas.