Rolih, B., Ameln, D., Vaidya, A., & Akcay, S. (2024). Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble.
Cita Chicago Style (17a ed.)Rolih, Blaž, Dick Ameln, Ashwin Vaidya, y Samet Akcay. Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble. 2024.
Cita MLA (9a ed.)Rolih, Blaž, et al. Divide and Conquer: High-Resolution Industrial Anomaly Detection via Memory Efficient Tiled Ensemble. 2024.
Precaución: Estas citas no son 100% exactas.