Simulating Charged Defects at Database Scale

Fuente: arXiv

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Bibliographic Details
Main Authors:	Shen, Jimmy-Xuan, Voss, Lars F., Varley, Joel Basile
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.05689