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Simulating Charged Defects at Database Scale

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Shen, Jimmy-Xuan, Voss, Lars F., Varley, Joel Basile
Natura:	Preprint
Pubblicazione:	2024
Soggetti:	Materials Science
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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