ES-FUZZ: Improving the Coverage of Firmware Fuzzing with Stateful and Adaptable MMIO Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Huang, Wei-Lun, Shin, Kang G.
Format:	Preprint
Published:	2024
Subjects:	Cryptography and Security
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.06281