A Bayesian Approach to OOD Robustness in Image Classification

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kaushik, Prakhar, Kortylewski, Adam, Yuille, Alan
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.07277