Fault Localization in a Microfabricated Surface Ion Trap using Diamond Nitrogen-Vacancy Center Magnetometry

Fuente: arXiv
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Bibliographic Details
Main Authors: Kehayias, Pauli, Delaney, Matthew A., Haltli, Raymond A., Clark, Susan M., Revelle, Melissa C., Mounce, Andrew M.
Format: Preprint
Published: 2024
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