TCAD Simulations of Humidity-Induced Breakdown of Silicon Sensors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Ninca, Ilona-Stefana, Bloch, Ingo, Bruers, Ben, Fadeyev, Vitaliy, Fernandez-Tejero, Xavi, Jessiman, Callan, Keller, John Stakely, Klein, Christoph Thomas, Koffas, Thomas, Lacker, Heiko Markus, Li, Peilin, Scharf, Christian, Staats, Ezekiel, Ullan, Miguel, Unno, Yoshinobu
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.09550