Citazione Stile APA (7a Edizione)

Arapkina, L. V., Chizh, K. V., Uvarov, O. V., Voronov, V. V., Dubkov, V. P., Storozhevykh, M. S., . . . Yuryev, V. A. (2024). Extended defects as a source of phonon confinement in polycrystalline Si and Ge films.

Citazione stile Chigago Style (17a edizione)

Arapkina, Larisa V., et al. Extended Defects as a Source of Phonon Confinement in Polycrystalline Si and Ge Films. 2024.

Citatione MLA (9a ed.)

Arapkina, Larisa V., et al. Extended Defects as a Source of Phonon Confinement in Polycrystalline Si and Ge Films. 2024.