Extended defects as a source of phonon confinement in polycrystalline Si and Ge films

Fuente: arXiv
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Bibliographic Details
Main Authors: Arapkina, Larisa V., Chizh, Kirill V., Uvarov, Oleg V., Voronov, Valery V., Dubkov, Vladimir P., Storozhevykh, Mikhail S., Poliakov, Maksim V., Volkova, Lidiya S., Edelbekova, Polina A., Klimenko, Alexey A., Dudin, Alexander A., Yuryev, Vladimir A.
Format: Preprint
Published: 2024
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