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Beyond structural stabilization of highly-textured AlN thin film: the role of chemical effects

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Pshyk, O. V., Patidar, J., Siol, S.
Formato:	Preprint
Publicado:	2024
Materias:	Materials Science
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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