Energy Correction Model in the Feature Space for Out-of-Distribution Detection

Fuente: arXiv
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Main Authors: Lafon, Marc, Rambour, Clément, Thome, Nicolas
Format: Preprint
Published: 2024
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author Lafon, Marc
Rambour, Clément
Thome, Nicolas
author_facet Lafon, Marc
Rambour, Clément
Thome, Nicolas
contents In this work, we study the out-of-distribution (OOD) detection problem through the use of the feature space of a pre-trained deep classifier. We show that learning the density of in-distribution (ID) features with an energy-based models (EBM) leads to competitive detection results. However, we found that the non-mixing of MCMC sampling during the EBM's training undermines its detection performance. To overcome this an energy-based correction of a mixture of class-conditional Gaussian distributions. We obtains favorable results when compared to a strong baseline like the KNN detector on the CIFAR-10/CIFAR-100 OOD detection benchmarks.
format Preprint
id arxiv_https___arxiv_org_abs_2403_10403
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Energy Correction Model in the Feature Space for Out-of-Distribution Detection
Lafon, Marc
Rambour, Clément
Thome, Nicolas
Computer Vision and Pattern Recognition
Artificial Intelligence
Machine Learning
In this work, we study the out-of-distribution (OOD) detection problem through the use of the feature space of a pre-trained deep classifier. We show that learning the density of in-distribution (ID) features with an energy-based models (EBM) leads to competitive detection results. However, we found that the non-mixing of MCMC sampling during the EBM's training undermines its detection performance. To overcome this an energy-based correction of a mixture of class-conditional Gaussian distributions. We obtains favorable results when compared to a strong baseline like the KNN detector on the CIFAR-10/CIFAR-100 OOD detection benchmarks.
title Energy Correction Model in the Feature Space for Out-of-Distribution Detection
topic Computer Vision and Pattern Recognition
Artificial Intelligence
Machine Learning
url https://arxiv.org/abs/2403.10403