Cita APA (7a ed.)

Yang, Y., Cattaneo, P., Raja, A. S., Weaver, B., Wang, R. N., Sapozhnik, A., . . . Kippenberg, T. J. (2024). Unifying frequency metrology across microwave, optical, and free-electron domains.

Cita Chicago Style (17a ed.)

Yang, Yujia, Paolo Cattaneo, Arslan S. Raja, Bruce Weaver, Rui Ning Wang, Alexey Sapozhnik, Fabrizio Carbone, Thomas LaGrange, y Tobias J. Kippenberg. Unifying Frequency Metrology Across Microwave, Optical, and Free-electron Domains. 2024.

Cita MLA (9a ed.)

Yang, Yujia, et al. Unifying Frequency Metrology Across Microwave, Optical, and Free-electron Domains. 2024.