Carrier confinement and alloy disorder exacerbate Auger-Meitner recombination in AlGaN ultraviolet light-emitting diodes

Fuente: arXiv

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Bibliographic Details
Main Authors:	Pant, Nick, Bushick, Kyle, McAllister, Andrew, Lee, Woncheol, Van de Walle, Chris G., Kioupakis, Emmanouil
Format:	Preprint
Published:	2024
Subjects:	Materials Science Disordered Systems and Neural Networks Mesoscale and Nanoscale Physics Applied Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.11019