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Carrier confinement and alloy disorder exacerbate Auger-Meitner recombination in AlGaN ultraviolet light-emitting diodes

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Pant, Nick, Bushick, Kyle, McAllister, Andrew, Lee, Woncheol, Van de Walle, Chris G., Kioupakis, Emmanouil
Format:	Preprint
Publié:	2024
Sujets:	Materials Science Disordered Systems and Neural Networks Mesoscale and Nanoscale Physics Applied Physics
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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