Theoretical investigation of the vertical dielectric screening dependence on defects for few-layered van der Waals materials

Fuente: arXiv

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Bibliographic Details
Main Authors:	Singh, Amit, Lee, Seunghan, Bae, Hyeonhu, Koo, Jahyun, Yang, Li, Lee, Hoonkyung
Format:	Preprint
Published:	2024
Subjects:	Materials Science Computational Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.11140