An Empirical Study on JIT Defect Prediction Based on BERT-style Model

Fuente: arXiv

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Bibliographic Details
Main Authors:	Guo, Yuxiang, Gao, Xiaopeng, Jiang, Bo
Format:	Preprint
Published:	2024
Subjects:	Software Engineering
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.11158