Cita APA (7a ed.)

Hsu, C., Lee, C., Sun, C., & Wu, K. (2024). OCR is All you need: Importing Multi-Modality into Image-based Defect Detection System.

Cita Chicago Style (17a ed.)

Hsu, Chih-Chung, Chia-Ming Lee, Chun-Hung Sun, y Kuang-Ming Wu. OCR Is All You Need: Importing Multi-Modality into Image-based Defect Detection System. 2024.

Cita MLA (9a ed.)

Hsu, Chih-Chung, et al. OCR Is All You Need: Importing Multi-Modality into Image-based Defect Detection System. 2024.