Intensity product-based optical sensing to beat the diffraction limit in an interferometer

Fuente: arXiv
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Autore principale: Ham, Byoung S.
Natura: Preprint
Pubblicazione: 2024
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author Ham, Byoung S.
author_facet Ham, Byoung S.
contents The classically defined minimum uncertainty of the optical phase is known as the standard quantum limit or shot-noise limit (SNL) originating in the uncertainty principle of quantum mechanics. Based on SNL, the phase sensitivity is inversely proportional to the square root K, where K is the number of interfering photons or statistically measured events. Thus, using a high-power laser is advantageous to enhance sensitivity due to the square root K gain in the signal-to-noise ratio. In a typical interferometer, however, the resolution remains in the diffraction limit of the K=1 case unless the interfering photons are resolved as in quantum sensing. Here, a projection-measurement method in quantum sensing is adapted for an interferometer to achieve an additional square root K gain in resolution. For the projection measurement, the interference fringe of an interferometer can be Kth-powered to replace the Kth-order intensity product. To understand many-wave interference-caused enhanced resolution, several types of interferometers are numerically compared to draw corresponding resolution parameters. As a result, the achieved resolution by the Kth power to an N-slit interferometer exceeds the diffraction limit and the Heisenberg limit in quantum sensing.
format Preprint
id arxiv_https___arxiv_org_abs_2403_13029
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Intensity product-based optical sensing to beat the diffraction limit in an interferometer
Ham, Byoung S.
Quantum Physics
Optics
The classically defined minimum uncertainty of the optical phase is known as the standard quantum limit or shot-noise limit (SNL) originating in the uncertainty principle of quantum mechanics. Based on SNL, the phase sensitivity is inversely proportional to the square root K, where K is the number of interfering photons or statistically measured events. Thus, using a high-power laser is advantageous to enhance sensitivity due to the square root K gain in the signal-to-noise ratio. In a typical interferometer, however, the resolution remains in the diffraction limit of the K=1 case unless the interfering photons are resolved as in quantum sensing. Here, a projection-measurement method in quantum sensing is adapted for an interferometer to achieve an additional square root K gain in resolution. For the projection measurement, the interference fringe of an interferometer can be Kth-powered to replace the Kth-order intensity product. To understand many-wave interference-caused enhanced resolution, several types of interferometers are numerically compared to draw corresponding resolution parameters. As a result, the achieved resolution by the Kth power to an N-slit interferometer exceeds the diffraction limit and the Heisenberg limit in quantum sensing.
title Intensity product-based optical sensing to beat the diffraction limit in an interferometer
topic Quantum Physics
Optics
url https://arxiv.org/abs/2403.13029