Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Laudari, Amrit, Pathiranage, Sameera, Thomas, Salim A., Petersen, Reed J., Anderson, Kenneth J., Pringle, Todd A., Hobbie, Erik K., Oncel, Nuri
Format:	Preprint
Published:	2024
Subjects:	Applied Physics Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2403.14865